Structure detection in low intensity X-ray images

CEA, DSM/DAPNIA, SAP, CEA-Saclay, F-91191 Gif-sur-Yvette Cedex, France

Received: 22 April 1997
Accepted: 10 July 1997

Abstract

In the context of assessing and characterizing structures in X-ray images, we compare different approaches. Most often the intensity level is very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the most reliable one. We also present a multi-resolution filtering method based on the wavelet coefficients detection. Comparative results are presented by means of a simulated cluster of galaxies.