Abstract
Lamellar heterostructures containing gallium nitride (GaN) have excellent photoelectric properties and also play an important role in lighting, the quantum field, and other fields. Exploring the nanoscale processing of lamellar heterostructure GaN is crucial to the manufacturing of high-performance devices based on heterostructure GaN. In this paper, the microstructure, surface morphology, dislocation length, Von Mises stress, temperature, number of removed atoms, and surface roughness of lamellar heterostructure GaN were systematically investigated using molecular dynamics simulation. The results show the presence of a large number of phase transitions, dislocation growth, and stress during nanogrinding; moreover, temperature also increases during this process. Furthermore, increasing the grinding speed will inhibit dislocation growth; increasing the grinding depth will cause extensive damage to the material surface. Therefore, this study presents a theoretical basis for the processing of lamellar heterostructure GaN.
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The data generated during the current study are available from the corresponding author on reasonable request.
References
Fujita S (2015) Wide-bandgap semiconductor materials: for their full bloom. Jpn J Appl Phys 54:030101
Malyk O (2012) Charge carrier mobility in gallium nitride. Diam Relat Mater 23:23–27
Możdżyńska EB, Kamiński P, Kozłowski R, Korona KP, Złotnik S, Jezierska E, Baranowski JM (2022) Effect of the growth temperature on the formation of deep-level defects and optical properties of epitaxial BGaN. J Mater Sci 57(36):17347–17362.
Ishikawa Y, Sugawara Y, Yokoe D et al (2023) Characterization of dislocations at the emission site by emission microscopy in GaN p–n diodes. J Mater Sci 58:9221–9232.
Narang K, Singh VK, Pandey A et al (2022) Suitability of thin-GaN for AlGaN/GaN HEMT material and device. J Mater Sci 57:5913–5923.
Wu MH, Chang SP, Liao WY et al (2013) Efficiency of GaN/InGaN double-heterojunction photovoltaic cells under concentrated illumination. Surf Coat Tech 231:253–256
Huang X, Lee FC, Li Q, Du W (2015) High-frequency high-efficiency GaN-based interleaved CRM bidirectional buck/boost converter with inverse coupled inductor. IEEE Trans Power Electr 31(6):4343–4352
Nord J, Albe K, Erhart P et al (2003) Modelling of compound semiconductors: analytical bond-order potential for gallium, nitrogen and gallium nitride. J Phys Condens Matter 15(32):5649–5662
Kim JH, Holloway PH (2004) Wurtzite to zinc-blende phase transition in gallium nitride thin films. Appl Phys Lett 84(5):711–713
Wang Y, Li L, Gao T, Gao Y, Liu Y, Zhang Z, Chen Q, Xie Q (2022) Crystallization behavior and defect analysis on induction growth of hexagonal GaN in isothermal relaxation. Vacuum 205:111475
Tetsuya K et al (2014) Hexagonal GaN microdisk with wurtzite/zinc-blende GaN crystal phase nano-heterostructures and high quality zinc-blende GaN crystal layer. Jpn J Appl Phys 53(6):068001
Xu HY, Liu Z, Liang Y, Rao YY, Zhang XT, Hark SK (2009) Structure and photoluminescence of wurtzite/zinc-blende heterostructure GaN nanorods. Appl Phys Lett 95(13):133108
Zainal N, Novikov SV, Akimov AV, Staddon CR, Foxon CT, Kent AJ (2012) Hexagonal (wurtzite) GaN inclusions as a defect in cubic (zinc-blende) GaN. Phys B: Condens Matter 407(15):2964–2966
Raychaudhuri S, Yu ET (2006) Calculation of critical dimensions for wurtzite and cubic zinc blende coaxial nanowire heterostructures. J Vac Sci Technol B: Microelectr Nanometer Struct Process Meas Phenom 24(4):2053–2059
Dipalo M, Gao Z, Scharpf J et al (2009) Combining diamond electrodes with GaN heterostructures for harsh environment ISFETs. Diam Relat Mater 18(5–8):884–889
Drory MD, Ager JW, Suski T et al (1996) Hardness and fracture toughness of bulk single crystal gallium nitride. Appl Phys Lett 69(26):4044–4046
Zhao P, Pan J, Zhao B, Wu J (2022) Molecular dynamics study of crystal orientation effect on surface generation mechanism of single-crystal silicon during the nano-grinding process. J Manuf Process 74:190–200
Bian Z, Gao T, Gao Y et al (2022) Effects of three-body diamond abrasive polishing on silicon carbide surface based on molecular dynamics simulations. Diam Relat Mater 129:109368
Wang Y, Tang S, Guo J (2020) Molecular dynamics study on deformation behaviour of monocrystalline GaN during nano abrasive machining. Appl Surf Sci 510:145492
Huang Y, Wang M, Xu Y et al (2020) Investigation on gallium nitride with N-vacancy defect nano-grinding by molecular dynamics. J Manuf Process 57:153–162
Li C, Hu Y, Zhang F et al (2023) Molecular dynamics simulation of laser assisted grinding of GaN crystals. Int J Mech Sci 239:107856
Zhang C, Dong Z, Zhang S, Guo X, Yuan S, Jin Z, Kang R, Guo D (2022) The deformation mechanism of gallium-faces and nitrogen-faces gallium nitride during nanogrinding. Int J Mech Sci 214:106888
Huang Y, Wang M, Xu Y, Zhu F (2021) Investigation of vibration-assisted nano-grinding of gallium nitride via molecular dynamics. Mater Sci Semicond Process 121:105372
Zhao P, Gao X, Zhao B et al (2023) Investigation on nano-grinding process of GaN using molecular dynamics simulation: nano-grinding parameters effect. J Manuf Process 102:429–442
Li C, Piao Y, Meng B et al (2022) Anisotropy dependence of material removal and deformation mechanisms during nanoscratch of gallium nitride single crystals on (0001) plane. Appl Surf Sci 578:152028
Li C, Hu Y, Wei Z et al (2024) Damage evolution and removal behaviors of GaN crystals involved in double-grits grinding. Int J Extreme Manuf 6(2):025103
Li C, Piao Y, Meng B et al (2022) Phase transition and plastic deformation mechanisms induced by self-rotating grinding of GaN single crystals. Int J Mach Tools Manuf 172:103827
Plimpton S (1995) Fast Parallel algorithms for short-range molecular dynamics. J Comput Phys 117:1–19
Thompson AP, Aktulga HM, Berger R, Bolintineanu DS, Brown WM, Crozier PS, In’t Veld PJ, Kohlmeyer A, Moore SG, Nguyen TD, Shan R (2022) LAMMPS-a flexible simulation tool for particle-based materials modeling at the atomic, meso, and continuum scales. Comput Phys Commun 271:108171
Stukowski A (2009) Visualization and analysis of atomistic simulation data with OVITO–the open visualization tool. Modell Simul Mater Sci Eng 18(1):015012
Jeng YR, Tsai PC, Fang TH (2004) Molecular dynamics investigation of the mechanical properties of gallium nitride nanotubes under tension and fatigue. Nanotechnology 15(12):1737
Guo J, Chen J, Wang Y (2020) Temperature effect on mechanical response of c-plane monocrystalline gallium nitride in nanoindentation: a molecular dynamics study. Ceram Int 46(8):12686–12694
Kang JW, Hwang HJ (2004) Atomistic study of III-nitride nanotubes. Comput Mater Sci 31(3–4):237–246
Chen M, Dai H (2022) Molecular dynamics study on grinding mechanism of polycrystalline silicon carbide. Diam Relat Mater 130:109541
Zhao P, Guo Y (2018) Grain size effects on indentation-induced defect evolution and plastic deformation mechanism of ploycrystalline materials. Comput Mater Sci 155:431–438
Liu H, Guo Y, Zhao P (2020) Surface generation mechanism of monocrystalline materials under arbitrary crystal orientations in nanoscale cutting. Mater Today Commun 25:101505
Stukowski A, Bulatov VV, Arsenlis A (2012) Automated identification and indexing of dislocations in crystal interfaces. Modell Simul mater sci eng 20(8):08500
Dai H, Hu Y, Wu W et al (2021) Molecular dynamics simulation of ultra-precision machining 3C-SiC assisted by ion implantation. J Manuf Process 69(4):398–411
Gao Y, Yan W, Gao T et al (2020) Properties of the structural defects during SiC–crystal–induced crystallization on the solid–liquid interface. Mat Sci Semicon Proc 116:105155
Ren J, Hao M, Lv M et al (2018) Molecular dynamics research on ultra-high-speed grinding mechanism of monocrystalline nickel. Appl Surf Sci 455:629–634
Hutchinson B, Ridley N (2006) On dislocation accumulation and work hardening in Hadfield steel. Scripta Mater 55(4):299–302
Guo X, Li Q, Liu T et al (2016) Molecular dynamics study on the thickness of damage layer in multiple grinding of monocrystalline silicon. Mater Sci Semicond Process 51:15–19
Zhao P, Zhao B, Pan J, Wu J (2022) Superimpose mechanism of surface generation process in grinding of monocrystalline silicon using molecular dynamics simulation. Mater Sci Semicond Process 147:106684
Maras E, Trushin O, Stukowski A, Ala-Nissila T, Jonsson H (2016) Global transition path search for dislocation formation in Ge on Si (001). Comput Phys Commun 205:13–21
Acknowledgements
This project was supported by the National Natural Science Foundation of China (Grant Nos. 62262021, 51761004, 51661005, and 11964005), Industry and Education Combination Innovation Platform of Intelligent Manufacturing and Graduate Joint Training Base at Guizhou University (Grant No. 2020-520000-83-01-324061), the Guizhou Province Science and Technology Fund, China (Grant Nos. ZK[2021] 051, [2017] 5788, and J[2015] 2050), High-Level Creative Talent in Guizhou Education Department of China, and the Cooperation Project of Science and Technology of Guizhou Province, China (Grant No. LH[2016] 7430).
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TG contributed to conceptualization, investigation, formal analysis, review, and editing draft. YW contributed to conceptualization, supervision, visualization, investigation, and writing—review and editing. LL contributed to conceptualization, methodology, and data curation. YG, YL, ZZ, ZB, and QX helped in investigation and writing—review and editing.
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Gao, T., Wang, Y., Li, L. et al. Molecular dynamics study on nanogrinding behavior of lamellar heterostructure gallium nitride. J Mater Sci 59, 12540–12554 (2024). https://doi.org/10.1007/s10853-024-09946-1
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DOI: https://doi.org/10.1007/s10853-024-09946-1