- Author
- Date
- 15-1-2022
- Title
- Spectroscopic signature of surface states and bunching of bulk subbands in topological insulator (Bi0.4 Sb0.6)2 Te3 thin films
- Journal
- Physical Review B
- Volume | Issue number
- 105 | 3
- Article number
- 035122
- Number of pages
- 7
- Document type
- Article
- Faculty
- Faculty of Science (FNWI)
- Institute
- Institute of Physics (IoP)
Van der Waals-Zeeman Institute (WZI) - Abstract
-
High-quality thin films of the topological insulator (Bi0.4 Sb0.6)2 Te3 have been deposited on SrTiO3 (111) by molecular beam epitaxy. Their electronic structure was investigated by in situ angle-resolved photoemission spectroscopy and in situ scanning tunneling spectroscopy. The experimental results reveal striking similarities with relativistic ab initio tight-binding calculations. We find that ultrathin slabs of the three-dimensional topological insulator (Bi0.4 Sb0.6)2 Te3 display topological surface states, surface states with large weight on the outermost Te atomic layer, and dispersive bulk energy levels that are quantized. We observe that the bandwidth of the bulk levels is strongly reduced. These bunched bulk states as well as the surface states give rise to strong peaks in the local density of states.
- URL
- go to publisher's site
- Other links
- Link to publication in Scopus
- Language
- English
- Note
- - ©2022 American Physical Society
- With supplementary file - Persistent Identifier
- https://hdl.handle.net/11245.1/e7edb411-aa21-457c-96b5-566e777e9210
- Downloads
-
PhysRevB.105.035122(Final published version)
- Supplementary materials
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