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Curved detectors for future X-ray astrophysics missions
Authors:
Eric D. Miller,
James A. Gregory,
Marshall W. Bautz,
Harry R. Clark,
Michael Cooper,
Kevan Donlon,
Richard F. Foster,
Catherine E. Grant,
Mallory Jensen,
Beverly LaMarr,
Renee Lambert,
Christopher Leitz,
Andrew Malonis,
Mo Neak,
Gregory Prigozhin,
Kevin Ryu,
Benjamin Schneider,
Keith Warner,
Douglas J. Young,
William W. Zhang
Abstract:
Future X-ray astrophysics missions will survey large areas of the sky with unparalleled sensitivity, enabled by lightweight, high-resolution optics. These optics inherently produce curved focal surfaces with radii as small as 2 m, requiring a large area detector system that closely conforms to the curved focal surface. We have embarked on a project using a curved charge-coupled device (CCD) detect…
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Future X-ray astrophysics missions will survey large areas of the sky with unparalleled sensitivity, enabled by lightweight, high-resolution optics. These optics inherently produce curved focal surfaces with radii as small as 2 m, requiring a large area detector system that closely conforms to the curved focal surface. We have embarked on a project using a curved charge-coupled device (CCD) detector technology developed at MIT Lincoln Laboratory to provide large-format, curved detectors for such missions, improving performance and simplifying design. We present the current status of this work, which aims to curve back-illuminated, large-format (5 cm x 4 cm) CCDs to 2.5-m radius and confirm X-ray performance. We detail the design of fixtures and the curving process, and present intial results on curving bare silicon samples and monitor devices and characterizing the surface geometric accuracy. The tests meet our accuracy requirement of <5 $μ$m RMS surface non-conformance for samples of similar thickness to the functional detectors. We finally show X-ray performance measurements of planar CCDs that will serve as a baseline to evaluate the curved detectors. The detectors exhibit low noise, good charge-transfer efficiency, and excellent, uniform spectroscopic performance, including in the important soft X-ray band.
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Submitted 26 June, 2024;
originally announced June 2024.
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Transmission grating arrays for the X-ray spectrometer on Arcus Probe
Authors:
Ralf K. Heilmann,
Alexander R. Bruccoleri,
James A. Gregory,
Eric M. Gullikson,
Hans Moritz Günther,
Edward Hertz,
Renee D. Lambert,
Douglas J. Young,
Mark L. Schattenburg
Abstract:
The Arcus Probe mission concept has been submitted as an Astrophysics Probe Explorer candidate. It features two co-aligned high-resolution grating spectrometers: one for the soft x-ray band and one for the far UV. Together, these instruments can provide unprecedented performance to address important key questions about the structure and dynamics of our universe across a large range of length scale…
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The Arcus Probe mission concept has been submitted as an Astrophysics Probe Explorer candidate. It features two co-aligned high-resolution grating spectrometers: one for the soft x-ray band and one for the far UV. Together, these instruments can provide unprecedented performance to address important key questions about the structure and dynamics of our universe across a large range of length scales. The X-ray Spectrometer (XRS) consists of four parallel optical channels, each featuring an x-ray telescope with a fixed array of 216 lightweight, high-efficiency blazed transmission gratings, and two CCD readout arrays. Average spectral resolving power $λ/Δλ> 2,500$ ($\sim 3500$ expected) across the 12-50 Å\ band and combined effective area $> 350$ cm$^2$ ($> 470$ cm$^2$ expected) near OVII wavelengths are predicted, based on the measured x-ray performance of spectrometer prototypes and detailed ray trace modeling. We describe the optical and structural design of the grating arrays, from the macroscopic grating petals to the nanoscale gratings bars, grating fabrication, alignment, and x-ray testing. Recent x-ray diffraction efficiency results from chemically thinned grating bars are presented and show performance above mission assumptions.
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Submitted 24 May, 2024;
originally announced May 2024.
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Toward volume manufacturing of high-performance soft x-ray critical-angle transmission gratings
Authors:
Ralf K. Heilmann,
Alexander R. Bruccoleri,
Jungki Song,
Matthew T. Cook,
James A. Gregory,
Renee D. Lambert,
Dimitri A. Shapiro,
Douglas J. Young,
Miranda Bradshaw,
Vadim Burwitz,
Gisela D. Hartner,
Andreas Langmeier,
Randall K. Smith,
Mark L. Schattenburg
Abstract:
High-resolution ($R = λ/Δλ> 2000$) x-ray absorption and emission line spectroscopy in the soft x-ray band is a crucial diagnostic for the exploration of the properties of ubiquitous warm and hot plasmas and their dynamics in the cosmic web, galaxy clusters, galaxy halos, intragalactic space, and star atmospheres. Soft x-ray grating spectroscopy with $R > 10{,}000$ has been demonstrated with critic…
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High-resolution ($R = λ/Δλ> 2000$) x-ray absorption and emission line spectroscopy in the soft x-ray band is a crucial diagnostic for the exploration of the properties of ubiquitous warm and hot plasmas and their dynamics in the cosmic web, galaxy clusters, galaxy halos, intragalactic space, and star atmospheres. Soft x-ray grating spectroscopy with $R > 10{,}000$ has been demonstrated with critical-angle transmission (CAT) gratings. CAT gratings combine the relaxed alignment and temperature tolerances and low mass of transmission gratings with high diffraction efficiency blazed in high orders. They are an enabling technology for the proposed Arcus grating explorer and were selected for the Lynx design reference mission grating spectrometer instrument. Both Arcus and Lynx require the manufacture of hundreds to perhaps $\approx 2000$ large-area CAT gratings. We are developing new patterning and fabrication process sequences that are conducive to large-format volume processing on state-of-the-art 200 mm wafer tools. Recent x-ray tests on 200 nm-period gratings patterned using e-beam-written masks and 4x projection lithography in conjunction with silicon pore focusing optics demonstrated $R \approx 10^4$ at 1.49 keV. Extending the grating depth from 4 $μ$m to 6 $μ$m is predicted to lead to significant improvements in diffraction efficiency and is part of our current efforts using a combination of deep reactive-ion etching and wet etching in KOH solution. We describe our recent progress in grating fabrication and report our latest diffraction efficiency and modeling results.
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Submitted 8 December, 2020;
originally announced December 2020.